JP

Activities:Soft error measures for safe and reliable infrastructure in a “super smart society”

Measures against soft errors

●A soft error is matter of a recently growing concern, thought to be one of the sources of failure in electrical equipment. It happens in electronic devices exposed to (cosmic) radiation and may cause temporary malfunction of equipment.

●The soft error stems from the interaction between a cosmic ray and a memory element, originating from a change of state called Single Event Upset (SEU) in the memory element.

●Problems in automated system operation:A soft-error rate goes up in automatic operating systems in which a large number of memory cells are used. The growing number of soft errors makes problems visible and may lead to serious effects on human society depending on individual situations.

●Problems in IoT:Since IoT is a system of interrelated many things including computing devices, provided with the ability to transfer data over a network, soft error troubles happening at several places spread through the internet so as to become apparent. Self-driving cars, industrial robots, etc. may suffer from the soft errors.

Challenges for commercialization and practical use of measures against soft errors

We need potential customers to notice the existence of troubles caused by soft errors, since they usually have no concrete experience with soft errors.

We need to develop advanced technology to evaluate the performance of a soft-error measure so that the customers are easy to do business with us.

Roadmap

Related sites:
Industry-academia collaboration group for soft-error research

Contact

Quantum beam Applications for Safe and Smart society (QASS) Staff Office
RCNP 2F, Osaka University
Mihogaoka 10-1, Ibaraki, Osaka 567-0047, Japan
Phone : +81-6-6879-8924
Mail : ou-opera@rcnp.osaka-u.ac.jp